ADLINK Technology (Taiwan) - ADLINK Technology Inc., a global leader in edge computing, has launched the new NEON-2000-JT2 AI-enabled smart camera series to make machine vision deployment for AI-based factory automation easier. Powered by NVIDIA Jetson TX2 AI modules the new smart camera series features all-in-one design, a small footprint and a pre-installed vision software set to reduce the complexity of AI machine vision development and integration.
The NEON-2000-JT2 helps increase production efficiency in labor-intensive manufacturing industries such as food and beverage, consumer packaged goods, farming and agriculture where quality insurance and inspection are critical to production success. One customer leveraging an ADLINK AI machine vision solution for product inspection was able to inspect 50x more product and achieve a 95% inspection accuracy, 3x more than previously possible. ADLINK expects customers to see even greater results with the NEON-2000-JT2 series.
“With our new all-in-one AI smart camera series we’ve done some of the AI machine vision development and integration already so customers can focus on production efficiency,” said Kevin Hsu, Senior Product Manager of ADLINK’s Smart Factory Business and Product Center. “Our current PoC customers are really enjoying the pre-installed integrations with other camera manufacturers, such as Basler, and combined GPU module integration which is helping to save development time.”
The NEON-2000-JT2 is designed with ease of use in mind. The AI-enabled smart camera includes sensor and GPU module integration, FPGA based DI/O design, a pre-installed deep learning software set and ready to use sample code for quick vision application development. Its safety certified by both the CE (European Commission) and FCC (United States Federal Communications Commission), and validated for shock, vibration and temperature stability for worry-free reliability as well.
The NEON-2000-JT2 series is optimized for various AI machine vision applications including product classification and defect inspection.
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